Keyphrases
Gallium Arsenide
56%
Molecular Beam Epitaxy
43%
Photoluminescence
40%
Ammonium
35%
Physical Properties
31%
Optical Properties
31%
Epilayer
30%
Germanium
27%
Room Temperature
27%
Transport Properties
26%
Silicon Wafer
26%
Resistive Random Access Memory (ReRAM)
24%
Phonons
24%
Superlattices
24%
HfO2
23%
Electrical Properties
23%
Amorphous Silicon
23%
Hydrogenated
20%
Memory Cell
19%
Nitric Acid
19%
SiGe
19%
Hexafluoride
18%
Wafer
18%
Black Silicon
16%
Si Wafer
15%
GaAs Substrate
15%
Oxides
15%
Absorption Bands
15%
Ge Dot
15%
Etching Process
15%
Ellipsometry
15%
Vibrational Modes
14%
SiOx
14%
Hydrogenation
13%
Porous Silicon
13%
Si Substrate
12%
Silicon Fluoride
12%
P-type Si
12%
Chlorine
12%
Recombination
12%
Glow Discharge
12%
Band Gap
12%
Heterointerface
12%
Photoluminescence Intensity
12%
Ultrathin
12%
Emission Band
11%
Photoluminescence Measurements
11%
Optics
11%
Downscaling
11%
Cm(III)
11%
Material Science
Photoluminescence
100%
Gallium Arsenide
51%
Oxide Compound
47%
Luminescence
36%
Germanium
33%
Epilayers
32%
Molecular Beam Epitaxy
31%
Silicon Wafer
28%
Amorphous Silicon
27%
Superlattice
26%
Oxidation Reaction
23%
Film
19%
Dielectric Material
17%
Porous Silicon
16%
Surface Defect
16%
Nanowires
16%
Density
15%
Quantum Well
15%
Hydrogenation
14%
Absorption Spectra
13%
Heterojunction
12%
Annealing
12%
Schottky Diode
11%
Electronic Circuit
10%
Structural Property
9%
Reactive Ion Etching
9%
Carrier Concentration
7%
Single Crystal
7%
Germanate
7%
Scanning Electron Microscopy
7%
Polycrystal
6%
Surface Structure
6%
Electron Mobility
6%
Epitaxial Film
6%
Field Effect Transistors
6%
X-Ray Diffraction
6%
Hall Mobility
6%
Electrical Resistivity
6%
Compound Semiconductor
5%
Tomography
5%
Resistive Random-Access Memory
5%
Dry Etching
5%
Epitaxy
5%
Spin Polarization
5%
Functional Surface
5%
Laser Ablation
5%
Surface Functionalization
5%
Nanoparticle
5%
Nanorods
5%
Hafnium
5%
Engineering
Resistive
27%
Gallium Arsenide
27%
Room Temperature
22%
Band Edge
19%
Oxide Layer
18%
Silicon Wafer
17%
Quantum Well
14%
Light Emission
13%
Optical Mode
13%
Annealing Temperature
12%
Band Gap
12%
Nanometre
12%
Hydrogenation
12%
Low-Temperature
12%
Energy Harvesting
11%
Structural Property
11%
Metallizations
11%
Nanowire
11%
Si Wafer
11%
Nanopillar
11%
Substrate Temperature
11%
Gaas Substrate
11%
Heterostructures
11%
Heat Treatment
10%
Ray Diffraction
10%
Dielectric Layer
10%
Strained Layer
10%
Superlattice
9%
Gaas Layer
8%
Field Emission
8%
Excited State
8%
Carrier Concentration
8%
Polycrystalline
8%
Thin Films
7%
Target Temperature
7%
Heat Rate
7%
FTIR Spectroscopy
7%
Glow Discharge
7%
Phase Composition
7%
Reliability Availability and Maintainability (Reliability Engineering)
6%
Dielectrics
6%
Optical Transition
6%
Critical Point
6%
Band Emission
6%
Nonvolatile Memory
6%
Field-Effect Transistor
6%
Raman Spectra
6%
Deep Level
5%
Related Defect
5%
Tensiles
5%
