TY - GEN
T1 - Impact of process tolerances on the performance of bond wire antennas at RF/microwave frequencies
AU - Ndip, Ivan
AU - Öz, Abdurrahman
AU - Tschoban, Christian
AU - Schmitz, Stefan
AU - Schneider-Ramelow, Martin
AU - Guttowski, Stephan
AU - Reichl, Herbert
AU - Lang, Klaus Dieter
PY - 2011
Y1 - 2011
N2 - Due to the multitude of advantages bond wire antennas have over conventional planar antennas (especially onchip planar antennas), they have received much research attention within the last four years. The focus of the contributions made so far has been on exploiting different configurations of single-element and array bond wire antennas for short-range applications at RF/microwave frequencies. However, the effects of process tolerances of bond wires on the radiation characteristics of bond wire antennas have not been studied in published literature. Therefore in this paper, we investigate the impact of up to 20% fluctuations in the parameters of bond wires on the performance of 42 GHz and 60 GHz bond wire antennas. Our results reveal that the length and radius of bond wires are the most and least sensitive parameters, respectively. Furthermore, the severity of the impact of process tolerances depends on the impedance bandwidth of the original antenna, before considering the tolerances. For example, a 10% change in the length of a bond wire causes the resonance frequency of a 42 GHz antenna to be shifted out of the specified 3GHz bandwidth (40.5 GHz-43.5 GHz) required for point-to-point communication. However, although a 10% change in length of a bond wire yields a 2.5 GHz shift in the resonance frequency of a 60 GHz bond wire antenna, it doesn't completely detune the antenna because of the original 6 GHz bandwidth available, prior to the fluctuation. Therefore, to prevent the impact of process tolerances from severely degrading the performance bond wire antennas, these antennas should be designed to have larger bandwidths than specified. For experimental verification, a bond wire antenna was designed, fabricated and measured. Very good correlation was obtained between measurement and simulation.
AB - Due to the multitude of advantages bond wire antennas have over conventional planar antennas (especially onchip planar antennas), they have received much research attention within the last four years. The focus of the contributions made so far has been on exploiting different configurations of single-element and array bond wire antennas for short-range applications at RF/microwave frequencies. However, the effects of process tolerances of bond wires on the radiation characteristics of bond wire antennas have not been studied in published literature. Therefore in this paper, we investigate the impact of up to 20% fluctuations in the parameters of bond wires on the performance of 42 GHz and 60 GHz bond wire antennas. Our results reveal that the length and radius of bond wires are the most and least sensitive parameters, respectively. Furthermore, the severity of the impact of process tolerances depends on the impedance bandwidth of the original antenna, before considering the tolerances. For example, a 10% change in the length of a bond wire causes the resonance frequency of a 42 GHz antenna to be shifted out of the specified 3GHz bandwidth (40.5 GHz-43.5 GHz) required for point-to-point communication. However, although a 10% change in length of a bond wire yields a 2.5 GHz shift in the resonance frequency of a 60 GHz bond wire antenna, it doesn't completely detune the antenna because of the original 6 GHz bandwidth available, prior to the fluctuation. Therefore, to prevent the impact of process tolerances from severely degrading the performance bond wire antennas, these antennas should be designed to have larger bandwidths than specified. For experimental verification, a bond wire antenna was designed, fabricated and measured. Very good correlation was obtained between measurement and simulation.
KW - 42 GHz Q-band
KW - 60 GHz WLAN/WPAN
KW - Bond wire antenna
KW - Point-to-point
KW - Process tolerances
UR - http://www.scopus.com/inward/record.url?scp=84879944116&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84879944116
SN - 9781618398505
T3 - 44th International Symposium on Microelectronics 2011, IMAPS 2011
SP - 914
EP - 920
BT - 44th International Symposium on Microelectronics 2011, IMAPS 2011
T2 - 44th International Symposium on Microelectronics 2011, IMAPS 2011
Y2 - 9 October 2011 through 13 October 2011
ER -