Abstract
Infrared absorption in polymer and glass-based thick film resistors has been measured between 400 and 1500 cm-1. Sample structures are discussed on the basis of X-ray, Fourier transform-infrared and resistance-temperature data. It is shown that in polymer-based thick film resistors, the particulate phase is mostly responsible for the infrared absorption between 400 and 900 cm-1, whereas the infrared absorption at higher wave numbers is related to the continuous phase. In glass-based thick film resistors, absorption is mostly determined by the highly doped glass. The results indicate that thick film resistors can be used as an absorbent coating in the 400-1500 cm-1 region by suitable selection of the continuous and particulate phases.
| Original language | English |
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| Pages (from-to) | 3346-3350 |
| Number of pages | 5 |
| Journal | Journal of Materials Science |
| Volume | 30 |
| Issue number | 13 |
| DOIs | |
| Publication status | Published - Jan 1995 |
| Externally published | Yes |