Surface plasmon resonance investigation procedure as a structure sensitive method for SnO 2 nanofilms

V. S. Grinevich; L. M. Filevska; I. E. Matyash; L. S. Maximenko; O. N. Mischuk; S. P. Rudenko; B. K. Serdega; V. A. Smyntyna; B. Ulug

doi:10.1016/j.tsf.2012.08.054

Surface plasmon resonance investigation procedure as a structure sensitive method for SnO ₂ nanofilms

V. S. Grinevich, L. M. Filevska, I. E. Matyash, L. S. Maximenko, O. N. Mischuk, S. P. Rudenko, B. K. Serdega, V. A. Smyntyna, B. Ulug

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

General principles of the surface plasmon resonance (SPR) phenomenon are applied to studying the structure and physical properties of thin conducting tin dioxide (SnO ₂) films. The SPR effects are detected and investigated by the methods of polarization modulation of the incident electromagnetic radiation. Angular and spectral dependencies of the reflection coefficients R _s ² and R _p ² for the s- and p-polarized radiation, together with their polarization difference ρ = R _s ² - R _p ² are measured in the wavelength range of 400-1600 nm. Experimentally obtained ρ(θ, λ) characteristics reflect the peculiar optical properties associated with the film structure and morphology. Surface plasmon-polaritons and local plasmons excited by s- and p-polarized radiation were observed. The results confirm that the SPR technique is a sensitive and informative method for the analysis of the SnO ₂ film structure.

Original language	English
Pages (from-to)	452-456
Number of pages	5
Journal	Thin Solid Films
Volume	522
DOIs	https://doi.org/10.1016/j.tsf.2012.08.054
Publication status	Published - 1 Nov 2012
Externally published	Yes

Keywords

Surface plasmon resonance
Thin films
Tin dioxide

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10.1016/j.tsf.2012.08.054

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title = "Surface plasmon resonance investigation procedure as a structure sensitive method for SnO 2 nanofilms",

abstract = "General principles of the surface plasmon resonance (SPR) phenomenon are applied to studying the structure and physical properties of thin conducting tin dioxide (SnO 2) films. The SPR effects are detected and investigated by the methods of polarization modulation of the incident electromagnetic radiation. Angular and spectral dependencies of the reflection coefficients R s 2 and R p 2 for the s- and p-polarized radiation, together with their polarization difference ρ = R s 2 - R p 2 are measured in the wavelength range of 400-1600 nm. Experimentally obtained ρ(θ, λ) characteristics reflect the peculiar optical properties associated with the film structure and morphology. Surface plasmon-polaritons and local plasmons excited by s- and p-polarized radiation were observed. The results confirm that the SPR technique is a sensitive and informative method for the analysis of the SnO 2 film structure.",

keywords = "Surface plasmon resonance, Thin films, Tin dioxide",

author = "Grinevich, {V. S.} and Filevska, {L. M.} and Matyash, {I. E.} and Maximenko, {L. S.} and Mischuk, {O. N.} and Rudenko, {S. P.} and Serdega, {B. K.} and Smyntyna, {V. A.} and B. Ulug",

year = "2012",

month = nov,

day = "1",

doi = "10.1016/j.tsf.2012.08.054",

language = "English",

volume = "522",

pages = "452--456",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

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TY - JOUR

T1 - Surface plasmon resonance investigation procedure as a structure sensitive method for SnO 2 nanofilms

AU - Grinevich, V. S.

AU - Filevska, L. M.

AU - Matyash, I. E.

AU - Maximenko, L. S.

AU - Mischuk, O. N.

AU - Rudenko, S. P.

AU - Serdega, B. K.

AU - Smyntyna, V. A.

AU - Ulug, B.

PY - 2012/11/1

Y1 - 2012/11/1

N2 - General principles of the surface plasmon resonance (SPR) phenomenon are applied to studying the structure and physical properties of thin conducting tin dioxide (SnO 2) films. The SPR effects are detected and investigated by the methods of polarization modulation of the incident electromagnetic radiation. Angular and spectral dependencies of the reflection coefficients R s 2 and R p 2 for the s- and p-polarized radiation, together with their polarization difference ρ = R s 2 - R p 2 are measured in the wavelength range of 400-1600 nm. Experimentally obtained ρ(θ, λ) characteristics reflect the peculiar optical properties associated with the film structure and morphology. Surface plasmon-polaritons and local plasmons excited by s- and p-polarized radiation were observed. The results confirm that the SPR technique is a sensitive and informative method for the analysis of the SnO 2 film structure.

AB - General principles of the surface plasmon resonance (SPR) phenomenon are applied to studying the structure and physical properties of thin conducting tin dioxide (SnO 2) films. The SPR effects are detected and investigated by the methods of polarization modulation of the incident electromagnetic radiation. Angular and spectral dependencies of the reflection coefficients R s 2 and R p 2 for the s- and p-polarized radiation, together with their polarization difference ρ = R s 2 - R p 2 are measured in the wavelength range of 400-1600 nm. Experimentally obtained ρ(θ, λ) characteristics reflect the peculiar optical properties associated with the film structure and morphology. Surface plasmon-polaritons and local plasmons excited by s- and p-polarized radiation were observed. The results confirm that the SPR technique is a sensitive and informative method for the analysis of the SnO 2 film structure.

KW - Surface plasmon resonance

KW - Thin films

KW - Tin dioxide

UR - http://www.scopus.com/inward/record.url?scp=84868530928&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2012.08.054

DO - 10.1016/j.tsf.2012.08.054

M3 - Article

AN - SCOPUS:84868530928

SN - 0040-6090

VL - 522

SP - 452

EP - 456

JO - Thin Solid Films

JF - Thin Solid Films

ER -

Surface plasmon resonance investigation procedure as a structure sensitive method for SnO ₂ nanofilms

Abstract

Keywords

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