Temperature dependent PL properties of ASF structures prepared by vapour etching technique

Ismail Kabacelik, Mukremin Yilmaz, Bulent Ulug

Research output: Contribution to journalConference articlepeer-review

Abstract

Temperature dependent photoluminescence (PL) measurements of (NH 4)2SiF6 (ASF) structures prepared by the well known vapour etching technique are carried out for temperatures ranging from 10K to 300K. It is observed that PL peak position shifts to higher energies and the intensity is reduced as the temperature decreases.

Original languageEnglish
Pages (from-to)610
Number of pages1
JournalAIP Conference Proceedings
Volume899
DOIs
Publication statusPublished - 2007
Externally publishedYes
Event6TH International Conference of the Balkan Physical Union - Istanbul, Turkey
Duration: 22 Aug 200626 Aug 2007

Keywords

  • Ammonium silicon fluoride
  • Luminescence
  • Vapour etching

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