Ana gezinime atla
Aramaya atla
Ana içeriğe atla
Bahçeşehir Üniversitesi Yurt içi
English
Türkçe
Yurt içi
Profiller
Araştırma Birimleri
Araştırma Sonucu
Basın / Medya
Uzmanlık alanı, ad ve ilişkiye göre ara
Uzmanla iletişime geçin
Scopus Profilini Görüntüle
Lütfi Arda
Prof. Dr.
Mekatronik Mühendisliği
E-posta
lutfi.arda
bau.edu
tr
h-index
1992
Alıntılar
28
h-indeks
Scopus alıntıları ve Pure'de kayıtlı yayın sayısına göre hesaplandı
2003
2025
Yıla göre araştırma sonucu
Genel bakış
Parmak izi
Ağ
Araştırma Sonucu
(101)
Benzer Profiller
(5)
Parmak izi
Lütfi Arda‘in aktif olduğu araştırma başlıklarına git. Bu konu etiketleri bu kişinin eserlerindendir. Birlikte benzersiz bir parmak izi oluştururlar.
Sıralama ölçütü
Ağırlık
Alfabetik sıralama
Keyphrases
Nanoparticles
72%
Magnetic Properties
68%
Structural Properties
64%
Structure-property Relationships
34%
Sol-gel Method
33%
X Ray Diffraction
30%
Sol-gel Process
30%
Room Temperature
25%
Lattice Parameter
25%
Scanning Electron Microscope
24%
Optical Properties
24%
Annealing
23%
Buffer Layer
22%
Co-doped ZnO Nanoparticles
22%
Surface Morphology
20%
Coated Conductor
19%
Microstructure
17%
Temperature Effect
16%
Doping Ratio
16%
Sol-gel
16%
Insulation Coating
15%
Zn1-xMgxO
15%
Hydrothermal Method
14%
Refractive Index
14%
Magnetization
13%
Nanorods
13%
Microstructure Properties
13%
Grain Size
13%
Structural & Optical Properties
13%
Annealing Temperature
13%
Sol-gel Dip Coating
12%
Mechanical Properties
12%
Photocatalytic Properties
12%
Particle Size
12%
Dip Coating
12%
Cu-doped ZnO
11%
Mg Doping
11%
Hexagonal Wurtzite
11%
X-ray Diffraction (XRD) Analysis
11%
Electrical Properties
10%
X-ray Diffraction Method
10%
Blood Compatibility
10%
ZnO Nanorods
10%
Room Temperature Ferromagnetism
10%
Morphological Properties
10%
Doping Effect
9%
Magnetic Moment
9%
Chelating Agent
9%
Magnetic Behavior
9%
ESR Spectra
9%
Material Science
Nanoparticle
100%
ZnO
89%
Sol-Gel
77%
X-Ray Diffraction
56%
Scanning Electron Microscopy
50%
Thin Films
42%
Conductor
26%
Lattice Constant
23%
Buffer Layer
23%
Structural Property
23%
Film
22%
Crystal Structure
21%
Density
16%
Surface Morphology
16%
Nanorods
15%
Annealing
14%
Photoluminescence
13%
Cobalt
12%
Hydrothermal Synthesis
11%
Refractive Index
11%
Ferromagnetism
10%
Oxide Compound
10%
Residual Stress
10%
Zirconia
10%
Grain Size
9%
Film Thickness
9%
Energy-Dispersive X-Ray Spectroscopy
9%
Thermogravimetric Analysis
9%
X Ray Diffraction Analysis
8%
Differential Thermal Analysis
8%
Stress Analysis
7%
Capacitance
7%
Magnesium Oxide
7%
Electron Paramagnetic Resonance Spectroscopy
7%
Crystallite Size
7%
Microhardness
7%
Microstructural Analysis
7%
Morphology
7%
Cerium Oxide
6%
Doping (Additives)
6%
Oxygen Vacancy
5%
Nanocrystalline
5%
Magnetic Structure
5%
Indentation
5%
Yttrium
5%
Engineering
Nanoparticles
61%
Thin Films
26%
Sol-Gel Process
25%
Ray Diffraction
23%
Scanning Electron Microscope
18%
Insulation Coating
15%
Structural Property
15%
Annealing Temperature
14%
Dip Coating
13%
Lattice Constant
13%
Lattice Parameter
11%
Room Temperature
10%
Crystal Structure
10%
Surface Morphology
9%
Magnetic Moment
9%
X-Ray Diffraction Analysis
8%
Polycrystalline
8%
Low-Temperature
7%
Refractive Index
7%
Refractivity
7%
Secondary Phase
6%
Applied Field
6%
Size Effect
6%
Ground State
6%
Hydrothermal Synthesis
6%
Biological Property
5%
Saturation Magnetization
5%
Measurement System
5%
Sensing Property
5%
Band Gap
5%
