Özet
Temperature dependent photoluminescence (PL) measurements of (NH 4)2SiF6 (ASF) structures prepared by the well known vapour etching technique are carried out for temperatures ranging from 10K to 300K. It is observed that PL peak position shifts to higher energies and the intensity is reduced as the temperature decreases.
Orijinal dil | İngilizce |
---|---|
Sayfa (başlangıç-bitiş) | 610 |
Sayfa sayısı | 1 |
Dergi | AIP Conference Proceedings |
Hacim | 899 |
DOI'lar | |
Yayın durumu | Yayınlanan - 2007 |
Harici olarak yayınlandı | Evet |
Etkinlik | 6TH International Conference of the Balkan Physical Union - Istanbul, Turkey Süre: 22 Ağu 2006 → 26 Ağu 2007 |