The Influence of Conductor Particle Size Distribution on the Blending Curve of Epoxy-Based Thick Film Resistors

Bulent Ulug; John M. Robertson; Peter J.S. Ewen

doi:10.1155/APEC.10.277

The Influence of Conductor Particle Size Distribution on the Blending Curve of Epoxy-Based Thick Film Resistors

Bulent Ulug, John M. Robertson, Peter J.S. Ewen

Araştırma sonucu: Dergi katkısı › Makale › bilirkişi

3 Alıntılar (Scopus)

Özet

The influence of conductor particle size distribution on the blending curve of epoxy-based thick film resistors has been investigated. It was found that the critical volume fraction shifts to higher values as the spread of the conductor particle size distribution decreases. The results are interpreted in terms of a model whose main parameter is the contact probability for the conductor particles.

Orijinal dil	İngilizce
Sayfa (başlangıç-bitiş)	277-284
Sayfa sayısı	8
Dergi	ElectroComponent Science and Technology
Hacim	10
Basın numarası	4
DOI'lar	https://doi.org/10.1155/APEC.10.277
Yayın durumu	Yayınlanan - 1983
Harici olarak yayınlandı	Evet

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10.1155/APEC.10.277

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@article{785ad9c12ab54c528fb824e8934f81a8,

title = "The Influence of Conductor Particle Size Distribution on the Blending Curve of Epoxy-Based Thick Film Resistors",

abstract = "The influence of conductor particle size distribution on the blending curve of epoxy-based thick film resistors has been investigated. It was found that the critical volume fraction shifts to higher values as the spread of the conductor particle size distribution decreases. The results are interpreted in terms of a model whose main parameter is the contact probability for the conductor particles.",

author = "Bulent Ulug and Robertson, {John M.} and Ewen, {Peter J.S.}",

year = "1983",

doi = "10.1155/APEC.10.277",

language = "English",

volume = "10",

pages = "277--284",

journal = "ElectroComponent Science and Technology",

issn = "0305-3091",

publisher = "Gordon and Breach Science Publishers",

number = "4",

}

TY - JOUR

T1 - The Influence of Conductor Particle Size Distribution on the Blending Curve of Epoxy-Based Thick Film Resistors

AU - Ulug, Bulent

AU - Robertson, John M.

AU - Ewen, Peter J.S.

PY - 1983

Y1 - 1983

N2 - The influence of conductor particle size distribution on the blending curve of epoxy-based thick film resistors has been investigated. It was found that the critical volume fraction shifts to higher values as the spread of the conductor particle size distribution decreases. The results are interpreted in terms of a model whose main parameter is the contact probability for the conductor particles.

AB - The influence of conductor particle size distribution on the blending curve of epoxy-based thick film resistors has been investigated. It was found that the critical volume fraction shifts to higher values as the spread of the conductor particle size distribution decreases. The results are interpreted in terms of a model whose main parameter is the contact probability for the conductor particles.

UR - http://www.scopus.com/inward/record.url?scp=0020749034&partnerID=8YFLogxK

U2 - 10.1155/APEC.10.277

DO - 10.1155/APEC.10.277

M3 - Article

AN - SCOPUS:0020749034

SN - 0305-3091

VL - 10

SP - 277

EP - 284

JO - ElectroComponent Science and Technology

JF - ElectroComponent Science and Technology

IS - 4

ER -

The Influence of Conductor Particle Size Distribution on the Blending Curve of Epoxy-Based Thick Film Resistors

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