X-ray diffraction analysis of powder and thin film of (Gd _1-xy_x)₂O₃ prepared by sol-gel process

Keyphrases

• Buffer Layer 100%
• Sol-gel Process 100%
• X-ray Diffraction (XRD) Analysis 100%
• Y(III) 66%
• Gd3+ 66%
• Crystallite Size 33%
• Sol-gel Dip Coating 33%
• Crack-free 33%
• Microstrain Analysis 33%
• Crystal System 33%
• Average Crystallite Size 33%
• Sol-gel Dipping 33%
• Mixed Oxides 33%
• Epitaxially Grown 33%
• Pinhole-free 33%
• Compositional Parameters 33%
• Microstructure Analysis 33%
• Crystal Structure Analysis 33%
• Dip Coating 33%
• X-ray Diffraction Data 33%
• Rietveld Refinement Method 33%
• Lattice Parameter 33%
• Size Analysis 33%
• Cationic Distribution 33%
• Degree of Alignment 33%
• Solid Solution 33%
• Crystal Orientation 33%

Material Science

• Sol-Gel 100%
• X Ray Diffraction Analysis 100%
• Thin Films 100%
• Buffer Layer 75%
• Crystallite Size 50%
• Microstructural Analysis 25%
• Lattice Constant 25%
• Crystal Microstructure 25%
• X-Ray Diffraction 25%
• Coating Process 25%
• Rietveld Refinement 25%
• Oxide Compound 25%
• Crystal Structure 25%
• Solid Solutions 25%